SPICA – Lock-in IR Thermography of Intego
Detection of the invisible
SPICA – NEW Lock-in IR Thermography Inspection System of Intego GmbH
INTEGO GmbH develops and produces customized, optical and thermographic inspection systems. Recently, INTEGO has developed SPICA, a highly sensitive inspection system based on Lock-in IR Thermography (LIT). LIT is a form of dynamic IR thermography which provides a much better signal-to-noise ratio, increased sensitivity and higher feature resolution than steady-state thermography. Further advantages are the short measuring time adjustable to the production cycling time, the contactless, non-destructive measurement principle and the large field-of-view.
Inspection of non-electrical defects, e.g. in laser welding seams
SPICA can detect non-electrical defects such as faulty laser welding seams, e.g. in plastics and metals as well as delaminations, voids and cracks etc. For these defects, optical excitation (flash, halogen and laser), inductive excitation, or in specific cases also electrical excitation are used.
Localizing electrical defects
SPICA is often used to localize failures in electronic devices (e.g. ICs, power electronic devices, solar cells, batteries etc.). The failures can be e.g. short circuits, shunts, leakage current, ESD defects, oxide damage, edge termination defects, defective transistors and diodes, device latch-ups, avalanche breakdown, electrically conductive contamination and (resistive) opens. In Fig. 1 a power electronic device having a surface defect is shown. For electrical defects electrical excitation is used in most cases.
SPICA available in different system designs
INTEGO offers SPICA in different system designs for optimal integration, starting with cost effective table-top systems, over semi-automatic systems for laboratory use (see Fig. 2) up to fully automated inline systems, suitable for integration in a high-volume production line. The spatial resolution and the cycle time can be adapted to fit specific needs, as well as the interface to the automation and various statistical evaluation methods.
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